2SC3122 2003-03-19 1 toshiba transistor silicon npn epitaxial planar type 2SC3122 tv vhf rf amplifier applications high gain: g pe = 24db (typ.) (f = 200 mhz) low noise: nf = 2.0db (typ.) (f = 200 mhz) excellent forward agc characteristics maximum ratings (ta 25c) characteristics symbol rating unit collector-base voltage v cbo 30 v collector-emitter voltage v ceo 30 v emitter-base voltage v ebo 3 v collector current i c 20 ma base current i b 10 ma collector power dissipation p c 150 mw junction temperature t j 125 c storage temperature range t stg 55~125 c electrical characteristics (ta 25c) characteristics symbol test condition min typ. max unit collector cut-off current i cbo v cb 25 v, i e 0 100 na emitter cut-off current i ebo v eb 2 v, i c 0 100 na collector-emitter breakdown voltage v (br) ceo i c 1 ma, i b 0 30 v dc current gain h fe v ce 10 v, i c 2 ma 60 150 300 reverse transfer capacitance c re v cb 10 v, i e 0, f 1 mhz 0.3 0.45 pf transition frequency f t v ce 10 v, i c 2 ma 400 650 mhz power gain g pe 20 24 28 db noise figure nf v ce 12 v, v agc 1.4 v, f 200 mhz 2.0 3.2 db agc voltage v agc v cc 12 v, gr 30db, f 200 mhz (note) 3.6 4.4 5.1 v note: v agc measured by test circuit shown in figure 1 when power gain is reduced to 30db compared that of v agc at 1.4 v. unit: mm jedec D jeita sc-59 toshiba 2-3f1a weight: 0.012 g (typ.)
2SC3122 2003-03-19 2 l1: rf coil m-15 t (toko inc.) or equivalent l2: rf coil m-25 t (toko inc.) or equivalent marking figure 1 200 mhz g pe , nf test circuit
2SC3122 2003-03-19 3
2SC3122 2003-03-19 4
2SC3122 2003-03-19 5 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707ea a restrictions on product use
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